Ключевые слова: bulk, cylinders, current distribution, trapped field distribution, crack formation, modeling, numerical analysis
Ключевые слова: HTS, bulk, cylinders, fracture behavior, crack formation, magnetic field dependence, magnetization, mechanical properties, numerical analysis
Ключевые слова: HTS, YBCO, bulk, mechanical properties, crack formation, electromagnetic forces, numerical analysis, fracture behavior, interaction
Ключевые слова: HTS, YBCO, bulk, crack formation, mechanical properties, precursors, fabrication, trapped field distribution
Ключевые слова: HTS, YBCO, bulk, crack formation, rods, stress effects, mechanical properties, modeling, numerical analysis
Ключевые слова: HTS, YBCO, bulk, single grain, fabrication, coatings, surface, crack formation, trapped field distribution, levitation performance, experimental results, magnetic properties
Ключевые слова: HTS, YBCO, bulk, fabrication, oxygenation treatments, microstructure, crack formation, Jc/B curves, pinning force, critical caracteristics
Ключевые слова: HTS, REBCO, bulk, single grain, porosity, crack formation, mechanical properties, fracture behavior, stress effects, tensile tests, experimental results
Ключевые слова: HTS, REBCO, bulk, mechanical properties, bending process, fatigue behavior, crack formation, stress effects, strain effects, fracture behavior, cycling, experimental results
Ключевые слова: HTS, bulk, cylinders, crack formation, numerical analysis
Chaud X., Gawalek W., Habisreuther T., Litzkendorf D., Prikhna T.A., Bierlich J., Moshchil V.E., Sergienko N.V., Rabier J., Savchuk Y.M., Dub S.N., Melnikov V.S., Joulain A.
Ключевые слова: HTS, YBCO, bulk, oxygenation treatments, crack formation, Jc/B curves, critical caracteristics, hardness, mechanical properties, microstructure, fabrication
Puig T., Pardo E., Sanchez A., Chen D.-X., Bartolome E., Obradors X.(obradors@icmab.es)
Ключевые слова: HTS, YBCO, bulk, rings, crack formation, ac performance, dc performance, magnetization curves, susceptibility, experimental results, magnetic properties
Thieme C.L., Ekin J.W., Xie Y., Cheggour N.(cheggour@ boulder.nist.gov)
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